Characterization of epitaxial surfaces and interfaces of wide band gap semiconductores /

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Bibliographic Details
Main Author: Xie, Xianning
Format: Thesis Book
Language:English
Published: 2003.
Subjects:
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035 |a ADA-9045 
040 |a UMM 
090 |a QD3  |b NUSP 2003 Xie 
100 1 0 |a Xie, Xianning. 
245 1 0 |a Characterization of epitaxial surfaces and interfaces of wide band gap semiconductores /  |c Xie Xianning. 
260 |c 2003. 
300 |a xxi, 234 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- Dept. of Chemistry, Faculty of Science, National University of Singapore, 2003. 
504 |a Bibliography: leaves 233-234. 
650 0 |a Wide gap semiconductors. 
650 0 |a Epitaxy. 
948 |a 14/04/2004  |b 14/04/2004 
596 |a 1 
999 |a QD3 NUSP 2003 XIE  |w LC  |c 1  |i A511117605  |d 4/9/2006  |f 4/9/2006  |g 1  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 4/2/2005