Design and construction of charge pumping technique for MOS transistor characterization /
Saved in:
主要作者: | Lee, Hock Guan |
---|---|
格式: | Thesis 圖書 |
語言: | English |
出版: |
2004.
|
主題: | |
在線閱讀: | http://studentsrepo.um.edu.my/id/eprint/2853 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Optimization and characterization of 130 Nm CMOS transistor design using TCAD simulation /
由: Hani Noorashiqin Abd Majid
出版: (2007) -
Characterization of hot-carrier degradation in submicrometer MOS transistors /
由: Ang, Diing Shenp
出版: (1997) -
New techniques for the characterization of hot-carrier degradation in MOS devices /
由: Leang, Sern Ee
出版: (1997) -
Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
由: Qin, Wei Han
出版: (1998) -
Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
由: Goh, Yong Han
出版: (1997)