Sangar Subramaniam. (2005). Dependence of physical and electronic properties on the thickness of silicon dioxide thin films.
Chicago Style (17th ed.) CitationSangar Subramaniam. Dependence of Physical and Electronic Properties on the Thickness of Silicon Dioxide Thin Films. 2005.
MLA引文Sangar Subramaniam. Dependence of Physical and Electronic Properties on the Thickness of Silicon Dioxide Thin Films. 2005.
警告:这些引文格式不一定是100%准确.