Dependence of physical and electronic properties on the thickness of silicon dioxide thin films /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2005.
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| Subjects: | |
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| Item Description: | Supervised by Prof. Dr. Muhamad Rasat Muhamad. |
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| Physical Description: | xvii, 204 leaves : ill. ; 30 cm. |
| Bibliography: | Bibliography: leaves 191. |