http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Dependence of physical and electronic properties on the thickness of silicon dioxide thin films
Supervised by Prof. Dr. Muhamad Rasat Muhamad.
Thesis (Ph.D.) -- Jabatan Fizik, Fakulti Sains, Universiti Malaya, 2005.