Goh, C. L. (2006). A study of stress in backend metallization in ULSI devices.
Chicago Style (17th ed.) CitationGoh, Chia Lan. A Study of Stress in Backend Metallization in ULSI Devices. 2006.
MLA (8th ed.) CitationGoh, Chia Lan. A Study of Stress in Backend Metallization in ULSI Devices. 2006.
Warning: These citations may not always be 100% accurate.