APA引文

Goh, C. L. (2006). A study of stress in backend metallization in ULSI devices.

Chicago Style (17th ed.) Citation

Goh, Chia Lan. A Study of Stress in Backend Metallization in ULSI Devices. 2006.

MLA引文

Goh, Chia Lan. A Study of Stress in Backend Metallization in ULSI Devices. 2006.

警告：這些引文格式不一定是100％准確.