Application of six sigma methodology for improving process yield in surface mount technology /

Application of six sigma methodology for improving process yield in surface mount technology /

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Bibliographic Details
Main Author: Nadiah Muhamad
Format: Thesis Book
Language:English
Published: 2011.
Subjects:
Six sigma (Quality control standard).
Surface mount technology > Quality control.
Printed circuits > Design and construction > Quality control.
Quality control > Standards.
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Description
Physical Description:xiii, 147 leaves : ill. (some col.) ; 30 cm.
Bibliography:Bibliography: leaves 142-143.

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