Soon, F. Y. (2012). Characterization of pmosfet degradation in negative bias temperature instability test.
Chicago Style (17th ed.) CitationSoon, Foo Yew. Characterization of Pmosfet Degradation in Negative Bias Temperature Instability Test. 2012.
MLA引文Soon, Foo Yew. Characterization of Pmosfet Degradation in Negative Bias Temperature Instability Test. 2012.
警告：这些引文格式不一定是100％准确.