A study on hot carrier effect (HCE) on LDD n-MOSFET /

A study on hot carrier effect (HCE) on LDD n-MOSFET /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Haziezol Helmi Mohd Yusof
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2013.
الموضوعات:	Metal oxide semiconductors. Metal oxide semiconductor field-effect transistors. Hot carriers.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

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