A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system /

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Bibliographic Details
Main Author: Woon, Hin Swee
Format: Thesis Book
Language:English
Published: 1988.
Subjects:
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008 910708s1988 si v 00 1 eng m
035 |a AAK-3730 
040 |a UMM 
090 |a TK7871.85  |b Woo 
100 1 0 |a Woon, Hin Swee. 
245 1 2 |a A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system /  |c by Woon Hin Swee. 
260 1 |c 1988. 
300 |a 140 leaves ;  |c 30 cm. 
500 |a Photocopy. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1988. 
504 |a Bibliography: leaves 136-140. 
650 0 |a Semiconductors  |x Impurities. 
650 0 |a Capacitance meters  |x Data processing. 
650 0 |a Deep Level Transient Spectroscopy. 
948 |a 13/08/1991  |b 03/09/2002 
596 |a 1 
999 |a TK7871.85 WOO  |w LC  |c 1  |i A010732791  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 19/2/1992