A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system /
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格式: | Thesis 圖書 |
語言: | English |
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1988.
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LEADER | 00879cam a2200253 a 4500 | ||
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001 | u94943 | ||
003 | SIRSI | ||
008 | 910708s1988 si v 00 1 eng m | ||
035 | |a AAK-3730 | ||
040 | |a UMM | ||
090 | |a TK7871.85 |b Woo | ||
100 | 1 | 0 | |a Woon, Hin Swee. |
245 | 1 | 2 | |a A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system / |c by Woon Hin Swee. |
260 | 1 | |c 1988. | |
300 | |a 140 leaves ; |c 30 cm. | ||
500 | |a Photocopy. | ||
502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1988. | ||
504 | |a Bibliography: leaves 136-140. | ||
650 | 0 | |a Semiconductors |x Impurities. | |
650 | 0 | |a Capacitance meters |x Data processing. | |
650 | 0 | |a Deep Level Transient Spectroscopy. | |
948 | |a 13/08/1991 |b 03/09/2002 | ||
596 | |a 1 | ||
999 | |a TK7871.85 WOO |w LC |c 1 |i A010732791 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 19/2/1992 |