Sharifah Shafini Syed Shahabuddin. (2013). Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection.
Chicago Style (17th ed.) CitationSharifah Shafini Syed Shahabuddin. Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistor Safe Operating Area (HCI-SOA) Characterization Under Hot Carrier Injection. 2013.
MLA (8th ed.) CitationSharifah Shafini Syed Shahabuddin. Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistor Safe Operating Area (HCI-SOA) Characterization Under Hot Carrier Injection. 2013.
Warning: These citations may not always be 100% accurate.