APA引文

Sharifah Shafini Syed Shahabuddin. (2013). Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection.

Chicago Style (17th ed.) Citation

Sharifah Shafini Syed Shahabuddin. Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistor Safe Operating Area (HCI-SOA) Characterization Under Hot Carrier Injection. 2013.

MLA引文

Sharifah Shafini Syed Shahabuddin. Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistor Safe Operating Area (HCI-SOA) Characterization Under Hot Carrier Injection. 2013.

警告：這些引文格式不一定是100％准確.