Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

Saved in:
Bibliographic Details
Main Author: Sharifah Shafini Syed Shahabuddin (Author)
Format: Thesis Book
Language:English
Published: 2013
Subjects:
Metal oxide semiconductors > Design and construction.
Integrated circuits > Design and construction.
Metal oxide semiconductor field-effect transistors.
Hot carriers.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:xx, 115 leaves : illustrations ; 30 cm.
Bibliography:Bibliography: leaves 102-107

Similar Items