Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Sharifah Shafini Syed Shahabuddin (مؤلف)
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2013
الموضوعات:	Metal oxide semiconductors > Design and construction. Integrated circuits > Design and construction. Metal oxide semiconductor field-effect transistors. Hot carriers.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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