Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

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書目詳細資料
主要作者:	Sharifah Shafini Syed Shahabuddin (Author)
格式:	Thesis 圖書
語言:	English
出版:	2013
主題:	Metal oxide semiconductors > Design and construction. Integrated circuits > Design and construction. Metal oxide semiconductor field-effect transistors. Hot carriers.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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