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Search Results - Electronics Nuclear engineering~
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Study on threshold voltage shifts and reliability in PFETs by high-voltage on-state and off-state stress
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Alias, Nurul Ezaila
Published 2013
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The development of vertical mosfet model incorporating a dielectric pocket
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Alias, Nurul Ezaila
Published 2009
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Nuclear
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Institution
Universiti Teknologi Malaysia
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UTM Institutional Repository
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Alias, Nurul Ezaila
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Universiti Teknologi Malaysia, Faculty of Electrical Engineering
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Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group
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