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Author:
Hanim Hussin
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Catalog
Language:
English
Suggested Topics:
Metal oxide semiconductor field-effect transistors
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Testing
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Author:
Hanim Hussin
Collection:
Catalog
Language:
English
Suggested Topics:
Metal oxide semiconductor field-effect transistors
AND
Testing
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Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
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Hanim Hussin
Published 2015
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...Microelectronics
Materials
Testing
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Institution
Universiti Malaya
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Catalog
Author
Hanim Hussin
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Universiti Malaya.
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Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group
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