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  1. 1
    Characterization of hot-carrier degradation in submicrometer MOS transistors /
    by Ang, Diing Shenp
    Published 1997
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  2. 2
    A study of hot-carrier effects using photon emission spectroscopy /
    by Tao, Jing Mei
    Published 1997
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  3. 3
    Extraction of submicron mosfet parameters /
    by Seah, Kah Suan
    Published 1997
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  4. 4
    Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
    by Tan, Suat Eng
    Published 1997
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  5. 5
    New techniques for the characterization of hot-carrier degradation in MOS devices /
    by Leang, Sern Ee
    Published 1997
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  6. 6
    Analytic methods for timing analysis of interconnects in CMOS very large scale integrated circuits /
    by Yong, Alan Kuen Fatt
    Published 1997
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  7. 7
    Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
    by Goh, Yong Han
    Published 1997
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  8. 8
    Characterization of pmosfet degradation in negative bias temperature instability test /
    by Soon, Foo Yew
    Published 2012
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  9. 9
    A study on the impact of processing parameters on low-voltage power MOSFET /
    by Nur Aqilah Othman
    Published 2012
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  10. 10
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
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  11. 11
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
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  12. 12
    Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
    by Fazliyatul Azwa Md Rezali
    Published 2017
    Thesis Book
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  13. 13
    Degradation analysis based on design considerations of advanced-process MOSFET /
    by Ainul Fatin Muhammad Alimin
    Published 2018
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  14. 14
    The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
    by Hoon, Siew Kuok
    Published 1998
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  15. 15
    A study of hot-carrier degradation in nitrided and conventional oxides /
    by Goo, Kah Heong
    Published 1998
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  16. 16
    Hot-carrier effects in thin gate oxide MOSFET's /
    by See, Leng Kian
    Published 1998
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  17. 17
    Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
    by Qin, Wei Han
    Published 1998
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  18. 18
    Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
    by Yip, Anselm
    Published 1998
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  19. 19
    Carrier lifetime characterization techniques in SOI and bulk silicon /
    by Cheng, Zhiyuan
    Published 1999
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  20. 20
    Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
    by Lim, Peng Soon
    Published 2001
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