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  1. 1
    Theoretical calculations of defect processes on the surface and bulk of semiconductors /
    by Khoo, Guan Seng
    Published 1992
    Thesis Book
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  2. 2
    Copper-induced deep level defects in GaAs0.6P0.4 alloy semiconductor /
    by Hu, Peh Yin
    Published 1992
    Thesis Book
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  3. 3
    Theory of non-radiative capture of carriers by multiphonon processes for deep centres in semiconductors /
    by Zheng, Jun Hui
    Published 1995
    Thesis Book
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  4. 4
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    by Wu, Zongmin
    Published 1996
    Thesis Book
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  5. 5
    Defect studies in gallium arsenide phosphide and confirmation of negative-U property of sulphur related DX center /
    by Luo, Yingying
    Published 1994
    Thesis Book
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  6. 6
    Pulse-duration dependent capacitance analysis and its application to copper in GaAs0.6P0.4 /
    by Han, Meng Kwong
    Published 1994
    Thesis Book
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  7. 7
    Theory of point defects in semiconductors /
    by Khoo, Guan Seng
    Published 1987
    Thesis Book
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  8. 8
    Study of the effect of process variation on wire bond process of IC assembly /
    by Intan Mastura Saadon
    Published 2012
    Thesis Book
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  9. 9
    Tight-binding molecular dynamics studies of clusters and defects in GaAs and AlAs /
    by Quek, Hoon Khim
    Published 1998
    Thesis Book
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  10. 10
    Sea of contact process to solve bondpad peeling /
    by Wong, Ching Fat
    Published 1998
    Thesis Book
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