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  1. 1
    Facades modification in identifying a personalized terrace home /
    by Irfan Mirzan Mahzan
    Published 2020
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  2. 2
    Development of quality assessment methods for wood images /
    by Heshalini Rajagopal
    Published 2021
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  3. 3
    Theoretical calculations of defect processes on the surface and bulk of semiconductors /
    by Khoo, Guan Seng
    Published 1992
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  4. 4
    Copper-induced deep level defects in GaAs0.6P0.4 alloy semiconductor /
    by Hu, Peh Yin
    Published 1992
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  5. 5
    Computational modelling of defects in brittle materials /
    by Cao, Wen
    Published 1993
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  6. 6
    Electron beam induced current/tunneling current microscopy of thin silicon dioxide films on silicon /
    by Pey, Kin San
    Published 1994
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  7. 7
    Theory of non-radiative capture of carriers by multiphonon processes for deep centres in semiconductors /
    by Zheng, Jun Hui
    Published 1995
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  8. 8
    Deep levels in high energy He+ irradiated silicon /
    by Sun, Xue Li
    Published 1996
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  9. 9
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    by Wu, Zongmin
    Published 1996
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  10. 10
    Bleeding and channelling of model bored pile /
    by Loh, Chang Kaan
    Published 1996
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  11. 11
    External cladding defects and proposed robotic inspection systems /
    by Ng, Paul Wai Meng
    Published 1992
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  12. 12
    Defect analysis of HDB buildings /
    by Yap, Eng Seng
    Published 1994
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  13. 13
    Defects rectification of HDB flats /
    by Ng, Chwee Geok
    Published 1994
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  14. 14
    Defect studies in gallium arsenide phosphide and confirmation of negative-U property of sulphur related DX center /
    by Luo, Yingying
    Published 1994
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  15. 15
    Pulse-duration dependent capacitance analysis and its application to copper in GaAs0.6P0.4 /
    by Han, Meng Kwong
    Published 1994
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  16. 16
    Alternative arrangements for handling post contract latent defects /
    by Lai, Weng Hoo
    Published 1991
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  17. 17
    Theory of point defects in semiconductors /
    by Khoo, Guan Seng
    Published 1987
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  18. 18
    Study of the effect of process variation on wire bond process of IC assembly /
    by Intan Mastura Saadon
    Published 2012
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  19. 19
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
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  20. 20
    Detection of defect in concrete using elastic wave tomography reconstruction technique /
    by Liu, Kit Fook
    Published 2017
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