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  1. 1
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Metal oxide semiconductors Design and construction....”
    Thesis Book
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  2. 2
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Subjects: “...Metal oxide semiconductor field-effect transistors Testing....”
    Thesis Book
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