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  1. 1
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Metal oxide semiconductors Design and construction....”
    Thesis Book
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  2. 2
    Design and construction of charge pumping technique for MOS transistor characterization /
    by Lee, Hock Guan
    Published 2004
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
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    Thesis Book
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