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  1. 1
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    by Yasmin Abdul Wahab
    Published 2015
    Subjects: “...Integrated circuits Very large scale integration....”
    Thesis Book
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  2. 2
    Practical design of CMOS power devices and control with ESD safety in a linear battery charger IC /
    Subjects: “...Integrated circuits Design....”
    Thesis Book
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