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  1. 1
    A built-in self-testable bit-slice processor /
    by Ibrahim Abubakr M.
    Published 1995
    Subjects: “...Integrated circuits Very large scale integration Testing...”
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    Thesis Book
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  2. 2
    Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost /
    by Siva Raman
    Published 1997
    Subjects: “...Integrated circuits...”
    Thesis Book
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  3. 3
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    by Yasmin Abdul Wahab
    Published 2015
    Subjects: “...Integrated circuits Very large scale integration....”
    Thesis Book
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  4. 4
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Subjects: “...Integrated circuits Defects....”
    Thesis Book
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