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  1. 1
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Subjects: “...Integrated circuits Defects....”
    Thesis Book
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  2. 2
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Integrated circuits Design and construction....”
    Thesis Book
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  3. 3
    Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
    by Fazliyatul Azwa Md Rezali
    Published 2017
    Subjects: “...Integrated circuit layout....”
    Thesis Book
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  4. 4
    Degradation analysis based on design considerations of advanced-process MOSFET /
    by Ainul Fatin Muhammad Alimin
    Published 2018
    Subjects: “...Electronic circuit design....”
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    Thesis Book
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