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Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
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Sharifah Shafini Syed Shahabuddin
Published 2013
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A study of hot carrier degradation in LDMOS transistor /
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Atikah Razi
Published 2013
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Impact of fabrication process on hot carrier injection in VDMOS transistor /
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Murti, Wijaya Bayu
Published 2013
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A study on hot carrier effect (HCE) on LDD n-MOSFET /
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Haziezol Helmi Mohd Yusof
Published 2013
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Institution
Universiti Malaya
4
Collection
Catalog
4
Author
Atikah Razi
1
Haziezol Helmi Mohd Yusof
1
Murti, Wijaya Bayu
1
Sharifah Shafini Syed Shahabuddin
1
Granting Institution
Universiti Malaya.
4
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