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  1. 1
    Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
    by Seah, Boon Pian
    Published 1995
    Thesis Book
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  2. 2
    Characterization of hot-carrier degradation in submicrometer MOS transistors /
    by Ang, Diing Shenp
    Published 1997
    Thesis Book
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  3. 3
    A study of hot-carrier effects using photon emission spectroscopy /
    by Tao, Jing Mei
    Published 1997
    Thesis Book
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  4. 4
    Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /
    by Lou, Choon Leong
    Published 1997
    Thesis Book
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  5. 5
    Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
    by Tan, Suat Eng
    Published 1997
    Thesis Book
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  6. 6
    Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
    by Goh, Yong Han
    Published 1997
    Thesis Book
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  7. 7
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Thesis Book
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  8. 8
    The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
    by Hoon, Siew Kuok
    Published 1998
    Thesis Book
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  9. 9
    A study of hot-carrier degradation in nitrided and conventional oxides /
    by Goo, Kah Heong
    Published 1998
    Thesis Book
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  10. 10
    Hot-carrier effects in thin gate oxide MOSFET's /
    by See, Leng Kian
    Published 1998
    Thesis Book
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  11. 11
    Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
    by Qin, Wei Han
    Published 1998
    Thesis Book
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  12. 12
    Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
    by Yip, Anselm
    Published 1998
    Thesis Book
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  13. 13
    A study of hot carrier degradation in LDMOS transistor /
    by Atikah Razi
    Published 2013
    Thesis Book
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  14. 14
    Impact of fabrication process on hot carrier injection in VDMOS transistor /
    by Murti, Wijaya Bayu
    Published 2013
    Thesis Book
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  15. 15
    A study on hot carrier effect (HCE) on LDD n-MOSFET /
    by Haziezol Helmi Mohd Yusof
    Published 2013
    Thesis Book
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