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  1. 1
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Metal oxide semiconductors Design and construction....”
    Thesis Book
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  2. 2
    Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
    by Seah, Boon Pian
    Published 1995
    Subjects: “...Metal oxide semiconductors Mathematical models...”
    Thesis Book
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