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  1. 1
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Metal oxide semiconductors Design and construction....”
    Thesis Book
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  2. 2
    Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /
    Subjects: “...Integrated circuits Design....”
    Thesis Book
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