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  1. 1
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Subjects: “...Metal oxide semiconductor field-effect transistors Testing....”
    Thesis Book
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  2. 2
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    by Yasmin Abdul Wahab
    Published 2015
    Subjects: “...Metal oxide semiconductors, Complementary Testing...”
    Thesis Book
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  3. 3
    Reka bentuk litar pengesan arus bagi pengujian logik dan iddq secara serentak /
    by Fahmi Samsuri
    Published 2002
    Subjects: “...Metal oxide semiconductorss, Complemantary Testing...”
    Thesis Book
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