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  1. 1
    Pulse-duration dependent capacitance analysis and its application to copper in GaAs0.6P0.4 /
    by Han, Meng Kwong
    Published 1994
    Subjects: “...Semiconductors Defects Measurement....”
    Thesis Book
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  2. 2
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    by Wu, Zongmin
    Published 1996
    Subjects: “...Semiconductors Defects Measurement....”
    Thesis Book
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  3. 3
    A case study of noise level and the mitigation at utilities area in a semiconductor company /
    by Elyana Abdul Rashid
    Published 2008
    Subjects: “...Semiconductor industry Noise Measurement....”
    Thesis Book
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