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  1. 1
    Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /
    Subjects: “...Integrated circuits Design....”
    Thesis Book
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  2. 2
    The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines /
    by Koh, David Khar Ann
    Published 1995
    Subjects: “...Integrated circuits Very large scale integration....”
    Thesis Book
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  3. 3
    Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
    by Seah, Boon Pian
    Published 1995
    Subjects: “...Integrated circuits Very large scale integration....”
    Thesis Book
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  4. 4
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Integrated circuits Design and construction....”
    Thesis Book
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