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Showing 1 - 2 results of 2 for search '"Metal oxide semiconductors."', query time: 0.03s Refine Results
  1. 1
    Reliability investigation of MOS devices under high current impulse stressing /
    by Teh, Gim Leong
    Published 1998
    Subjects: “...Metal oxide semiconductors Reliability...”
    Thesis Book
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  2. 2
    Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
    by Lim, Peng Soon
    Published 2001
    Subjects: “...Metal oxide semiconductor field-effect transistors Reliability...”
    Thesis Book
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