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Showing 1 - 3 results of 3 for search '"Semiconductors"', query time: 0.01s Refine Results
  1. 1
    Reliability investigation of MOS devices under high current impulse stressing /
    by Teh, Gim Leong
    Published 1998
    Subjects: “...Metal oxide semiconductors Reliability...”
    Thesis Book
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  2. 2
    Study of the effect of process variation on wire bond process of IC assembly /
    by Intan Mastura Saadon
    Published 2012
    Subjects: “...Semiconductors Failures....”
    Thesis Book
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  3. 3
    Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
    by Lim, Peng Soon
    Published 2001
    Subjects: “...Metal oxide semiconductor field-effect transistors Reliability...”
    Thesis Book
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