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  1. 1
    Characterization of pmosfet degradation in negative bias temperature instability test /
    by Soon, Foo Yew
    Published 2012
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
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    Thesis Book
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  2. 2
    Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability /
    by Muhammad Faiz Bukhori
    Published 2011
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
    Thesis Book
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  3. 3
    Design and construction of charge pumping technique for MOS transistor characterization /
    by Lee, Hock Guan
    Published 2004
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
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    Thesis Book
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