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  1. 1
    Electromigration damage in lead-free solder joints prepared using metallic nanoparticle doped flux /
    由 Nasir, Muhammad
    出版 2017
    主题: “...Integrated circuits Defects....”
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  2. 2
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    由 Hanim Hussin
    出版 2015
    主题: “...Integrated circuits Defects....”
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