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Showing 1 - 2 results of 2 for search '"Integrated circuits Design and construction Quality control"', query time: 0.02s Refine Results
  1. 1
    Statistical yield analysis for IC manufacturing /
    by Yam, Hong See
    Published 1997
    Subjects: “...Integrated circuits Design and construction Quality control Statistical methods...”
    Thesis Book
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  2. 2
    An intelligent walk-through IC package inspection system /
    by Lim, Seong Liang
    Published 1995
    Subjects: “...Integrated circuits Design and construction Quality control...”
    Thesis Book
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