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Showing 1 - 20 results of 39 for search '"Metal oxide semiconductor field-effect transistors"', 查询时间: 0.03s Refine Results
  1. 1
    A study on the impact of processing parameters on low-voltage power MOSFET /
    由 Nur Aqilah Othman
    出版 2012
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  2. 2
    Extraction of submicron mosfet parameters /
    由 Seah, Kah Suan
    出版 1997
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  3. 3
    Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs
    由 Ahmed, Rabah Abood
    出版 2013
    主题: “...Metal oxide semiconductor field-effect transistors...”
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  4. 4
    Characterization of hot-carrier degradation in submicrometer MOS transistors /
    由 Ang, Diing Shenp
    出版 1997
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  5. 5
    Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
    由 Tan, Suat Eng
    出版 1997
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  6. 6
    New techniques for the characterization of hot-carrier degradation in MOS devices /
    由 Leang, Sern Ee
    出版 1997
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  7. 7
    Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
    由 Goh, Yong Han
    出版 1997
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  8. 8
    Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability /
    由 Muhammad Faiz Bukhori
    出版 2011
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  9. 9
    The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
    由 Hoon, Siew Kuok
    出版 1998
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  10. 10
    A study of hot-carrier degradation in nitrided and conventional oxides /
    由 Goo, Kah Heong
    出版 1998
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  11. 11
    Hot-carrier effects in thin gate oxide MOSFET's /
    由 See, Leng Kian
    出版 1998
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  12. 12
    Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
    由 Qin, Wei Han
    出版 1998
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  13. 13
    Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
    由 Yip, Anselm
    出版 1998
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  14. 14
    Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
    由 Lim, Peng Soon
    出版 2001
    主题: “...Metal oxide semiconductor field-effect transistors Reliability...”
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  15. 15
    The effect of doping concentration on the characteristics of n-channel MOSFET /
    由 Teen, Soh Hong
    出版 2005
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  16. 16
    Development of empirical potential profile model for unusual energy separation of subbands in inidium-absorbed Si(111) inversion layer /
    由 Nur Idayu binti Ayob
    出版 2015
    主题: “...Metal oxide semiconductor field-effect transistors...”
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  17. 17
    Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
    由 Fazliyatul Azwa Md Rezali
    出版 2017
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  18. 18
    Degradation analysis based on design considerations of advanced-process MOSFET /
    由 Ainul Fatin Muhammad Alimin
    出版 2018
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  19. 19
    Carrier lifetime characterization techniques in SOI and bulk silicon /
    由 Cheng, Zhiyuan
    出版 1999
    主题: “...Metal oxide semiconductor field-effect transistors....”
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  20. 20
    Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /
    由 Lun, Zhao
    出版 2002
    主题: “...Metal oxide semiconductor field-effect transistors....”
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