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  1. 1
    Failure Analysis Investigation on 2N7002LTI TMOS Device Due to Electrostatic Discharge (ESD) Failures
    by Abdul Manaf, Abdul Halim
    Published 1998
    Subjects: “...Semiconductors - Failures - Case studies...”
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    Thesis
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  2. 2
    Study of the effect of process variation on wire bond process of IC assembly /
    by Intan Mastura Saadon
    Published 2012
    Subjects: “...Semiconductors Failures....”
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