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  1. 1
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    由 Wu, Zongmin
    出版 1996
    主題: “...Semiconductors Impurities....”
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  2. 2
    A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system /
    由 Woon, Hin Swee
    出版 1988
    主題: “...Semiconductors Impurities....”
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  3. 3
    Effects of isotopic neutron emission on silicon substrate /
    由 Roslan bin Yahya
    出版 2009
    主題: “...Semiconductors Impurity distribution 116447...”
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