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Sim, Kian Sin
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Sim, Kian Sin
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Sim, Kian Sin
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A study of specimen charging in electron beam systems /
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Sim
,
Kian
Sin
Published 1994
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Electron beam testing of integrated circuits using a modified scanning electron microscope /
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Sim
,
Kian
Sin
Published 1990
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Related Subjects
Electron beams
Electrons
Emission
Industrial applications
Integrated circuits
Probes (Electronic instruments)
Testing
Very large scale integration
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