CMOS compatible vertical surround gate mosfets with reduced parasitics /

مواد مشابهة

• New techniques for the characterization of hot-carrier degradation in MOS devices /
  بواسطة: Leang, Sern Ee
  منشور في: (1997)
• Hot-carrier effects in thin gate oxide MOSFET's /
  بواسطة: See, Leng Kian
  منشور في: (1998)
• Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
  بواسطة: Goh, Yong Han
  منشور في: (1997)
• Extraction of submicron mosfet parameters /
  بواسطة: Seah, Kah Suan
  منشور في: (1997)
• Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
  بواسطة: Tan, Suat Eng
  منشور في: (1997)