Artificial neural network based controller for fast and accurate atomic force microscope /

Artificial neural network based controller for fast and accurate atomic force microscope /

Despite its wide use in Atomic Force Microscopies (AFM), the performance of Piezoelectric Tube Scanner is limited by vibration and inherent nonlinearities that include hysteresis and creep. These limitations restrict the use of Piezoelectric Tube Scanner in fast and accurate operation of atomic forc...

وصف كامل

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Othman, Yahya Sherif
التنسيق:	أطروحة
اللغة:	English
منشور في:	Kuala Lumpur: Kulliyyah of Engineering, International Islamic University Malaysia, 2013
الموضوعات:	Theses, IIUM local
الوصول للمادة أونلاين:	Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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