Development of a MOSFET based electrostatics detection technique /
The destructive nature of high voltage has been noticeable for a long time in history. The friction of the object or the electrostatic induction can generate electric charges anywhere at any time, leading to the origination of high voltage electrostatic (HVES) fields. Unexpectedly HVES fields cause...
Saved in:
主要作者: | Aktar, Mahfuza (Author) |
---|---|
格式: | Thesis |
語言: | English |
出版: |
Kuala Lumpur :
Kulliyyah of Engineering, Internatonal Islamic University Malaysia,
2021
|
主題: | |
在線閱讀: | http://studentrepo.iium.edu.my/handle/123456789/10681 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Electrostatic transduction for MEMS resonators /
由: Bhave, Sunil Ashok
出版: (2004) -
Extraction of submicron mosfet parameters /
由: Seah, Kah Suan
出版: (1997) -
Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
由: Goh, Yong Han
出版: (1997) -
Two-dimensional analytical modelling of the short-channel mosfet /
由: Kendall, James D. 1959-
出版: (1987) -
Hot-carrier effects in thin gate oxide MOSFET's /
由: See, Leng Kian
出版: (1998)