Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System

Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application.

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Bibliographic Details
Main Author:	Sim, Kok Swee
Format:	Thesis
Published:	2006
Subjects:	TK Electrical engineering Electronics Nuclear engineering
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id	my-mmu-ep.1174
record_format	uketd_dc
spelling	my-mmu-ep.11742010-08-23T00:59:49Z Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System 2006-04 Sim, Kok Swee TK Electrical engineering. Electronics Nuclear engineering Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application. 2006-04 Thesis http://shdl.mmu.edu.my/1174/ http://myto.perpun.net.my/metoalogin/logina.php phd doctoral Multimedia University Research Library
institution	Multimedia University
collection	MMU Institutional Repository
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Sim, Kok Swee Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
description	Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application.
format	Thesis
qualification_name	Doctor of Philosophy (PhD.)
qualification_level	Doctorate
author	Sim, Kok Swee
author_facet	Sim, Kok Swee
author_sort	Sim, Kok Swee
title	Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
title_short	Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
title_full	Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
title_fullStr	Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
title_full_unstemmed	Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
title_sort	signal -to-noise ratio estimation in scanning electron microscope imaging system
granting_institution	Multimedia University
granting_department	Research Library
publishDate	2006
_version_	1747829308536127488

Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System

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