Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application.
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| Format: | Thesis |
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2006
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