Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology

In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list...

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Bibliographic Details
Main Author: Ke, Joseph Kian Seng
Format: Thesis
Published: 2005
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