APA引文

Ke, J. K. S. (2005). Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology.

Chicago Style (17th ed.) Citation

Ke, Joseph Kian Seng. Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. 2005.

MLA引文

Ke, Joseph Kian Seng. Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. 2005.

警告：這些引文格式不一定是100％准確.