APA (7th ed.) Citation

Ke, J. K. S. (2005). Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology.

Chicago Style (17th ed.) Citation

Ke, Joseph Kian Seng. Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. 2005.

MLA (8th ed.) Citation

Ke, Joseph Kian Seng. Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. 2005.

Warning: These citations may not always be 100% accurate.